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Effect of flag smut on yield and yield components of wheat varieties



Effect of flag smut on yield and yield components of wheat varieties



Crop Research (Hisar) 5(2): 348-351



Nine commercially grown wheat varieties evaluated against flag smut [Urocystis agropyri] revealed the reduction in yield ranging between 22.93 and 65.41 percent being maximum in variety WH 147 and minimum in Sonalika. The disease also had an adverse effect on yield components in smutted plants over healthy plants. TThe reduction in tillering ranged between 15.73-45.05 percent, plant height 36.92-61.81 percent, earhead length 27.92-45.69 percent and 1000-grain weight 19.01-36.70 percent in different wheat varieties. The percent reduction in yield and yield components varied from variety to variety depending upon the interaction between the host and the pathogen.

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Accession: 002082474

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