Classification of cultivation area of ginseng radix with NIR and Raman spectroscopy

Woo YoungAh; Kim HyoJin; Chung Hoeil

Analyst 124(8): 1223-1226

1999


ISSN/ISBN: 0003-2654
DOI: 10.1039/a902396h
Accession: 003068531

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Abstract
A rapid and non-destructive method for the classification of Panax ginseng according to cultivation area (Korea Republic and China) using near infrared (NIR) reflectance spectroscopy is described. Although there were no obvious differences in the raw NIR spectra based on cultivation area, spectral features were enhanced and differentiated by utilizing a second-derivative algorithm. Using principal component analysis the cultivation area was clearly differentiated in the principal component space. To develop a classification rule, partial least squares discriminant analysis was carried out. Sample provenance could be successfully classified and predicted using NIR reflectance spectroscopy combined with discriminant analysis. FT-Raman spectroscopy, which provided more qualitative information and easy sample measurement, was also investigated for the same purpose. The results showed that the classification performance using NIR reflectance spectroscopy was superior to that using Raman spectroscopy.

Classification of cultivation area of ginseng radix with NIR and Raman spectroscopy