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Correlation between traits and path analysis for grain yield in sorghum (Sorghum bicolor L. Moench)

Correlation between traits and path analysis for grain yield in sorghum (Sorghum bicolor L. Moench)

Iranian Journal of Agricultural Sciences 28(1): 73-86

Nineteen topcrosses of sorghum, including the paternal parent and 19 male fertile maternal lines, were evaluated and information on yield components subjected to path analysis. Lines were sown on two dates (1 and 16 May) and at two row spacings (10 and 20 cm) in favourable and unfavourable environments. Significant differences were noted between the two environments for all traits studied except test weight and panicle weight.

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Accession: 003081124

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