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Evaluation of trace element sensitivities in proton induced x ray emission analysis of low temperature ashed serum samples

Lecomte, R.; Landsberger, S.; Monaro, S.

International Journal of Applied Radiation and Isotopes 33(2): 121-126

1982


ISSN/ISBN: 0020-708X
Accession: 005404713

Trace-element sensitivities in PIXE [proton-induced X-ray emission] analysis are evaluated in serum samples [from humans] prepared with freeze-drying and low-temperature-ashing techniques. The latter target-preparation method yields better detectability limits for all elements. However, the gain in sensitivity, which is at the most 60% for low-Z elements, is not considered large enough to warrant the use of dry-ashing procedures in PIXE batch-analysis situations as is usually the case in biomedical work.

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