Section 6
Chapter 5,405

Evaluation of trace element sensitivities in proton induced x ray emission analysis of low temperature ashed serum samples

Lecomte, R.; Landsberger, S.; Monaro, S.

International Journal of Applied Radiation and Isotopes 33(2): 121-126


ISSN/ISBN: 0020-708X
Accession: 005404713

Trace-element sensitivities in PIXE [proton-induced X-ray emission] analysis are evaluated in serum samples [from humans] prepared with freeze-drying and low-temperature-ashing techniques. The latter target-preparation method yields better detectability limits for all elements. However, the gain in sensitivity, which is at the most 60% for low-Z elements, is not considered large enough to warrant the use of dry-ashing procedures in PIXE batch-analysis situations as is usually the case in biomedical work.

PDF emailed within 1 workday: $29.90