Flag leaf its components and grain yield of wheat triticum aestivum

Dhiman, S.D.; Sharma, H.C.; Singh, R.P.; Sharma, S.C.

Haryana​ ​Agricultural​ ​University​ ​Journal​ ​of​ ​Research 10(3): 329-332

1980


ISSN/ISBN: 0379-4008
Accession: 005466360

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Abstract
Wheat genotypes significantly varied in respect of grain yield, flag leaf area (FLA) and leaf angle (with peduncle). A positive association was recorded between grain yield and flag leaf area. The base angle of flag leaf with peduncle was also positively correlated with the grain weight per meter row length. Higher FLA and wide base angle, preferably more than 45.degree., are suitable parameters for evolving genotypes with high photosynthetic rate and high yield of wheat.