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Relationship of spectral parameters of wheat triticum aestivum crop with yield



Relationship of spectral parameters of wheat triticum aestivum crop with yield



Indian Journal of Agricultural Sciences 53(2): 89-93



Spectral reflectance data from the field of wheat (T. aestivum Linn. emend. Thell.) collected during the growing season were correlated with its yield. IR:red light reflectance ratio and the normalized difference vegetation index were highly and linearly correlated with total dry-matter production and grain yield, establishing the potential of remote sensing for predicting grain and biological yields. The correlation was maximum during a period of 40 days, 55 to 95 days after sowing.

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Accession: 006301310

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