EurekaMag.com logo
+ Site Statistics
References:
52,725,316
Abstracts:
28,411,598
+ Search Articles
+ Subscribe to Site Feeds
EurekaMag Most Shared ContentMost Shared
EurekaMag PDF Full Text ContentPDF Full Text
+ PDF Full Text
Request PDF Full TextRequest PDF Full Text
+ Follow Us
Follow on FacebookFollow on Facebook
Follow on TwitterFollow on Twitter
Follow on Google+Follow on Google+
Follow on LinkedInFollow on LinkedIn

+ Translate

Specimen coating for high resolution scanning electron microscopy


Scanning 4(4): 169-174
Specimen coating for high resolution scanning electron microscopy
Thin conducting films, produced by evaporation or soft vacuum sputtering generally show cracks and grain formation, when examined under high resolution scanning electron microscopy. These artifacts can obscure surface features of coated specimens or cause confusion in the interpretation of micrographs. No such structures were observed in films produced by ion beam deposition. Ion beam deposition equipment is described in which a cold cathode saddle field ion source, operating at low pressure (15 mPa [Pascal]), produces a 2 mm diameter beam of energetic ions (5 keV) and neutrals. With the beam directed onto a target at 30.degree. to glancing incidence, the sputtered material coats the specimens, which are held in a planetary system for good coverage. Conditions favoring fine grain growth are a high nucleation density and low energy transfer to the substrate by thermal conduction or radiation or by particle or photon radiation. These conditions are satisfied by ion beam deposition but evidently not by evaporation or soft vacuum sputtering. With the specimen [Chrysochromulina chiton, 2-oleodistearine, and cotton fibers] stationary, sharp shadowing is obtained because the target acts almost as a point source, because of the small diameter of the beam and because there is little scatter at the operating pressure.

Accession: 006459260

DOI: 10.1002/sca.4950040402

Download PDF Full Text: Specimen coating for high resolution scanning electron microscopy



Related references

Scanning electron microscopy 1977 vol 1 proceedings of the 10th annual scanning electron microscope symposium and workshops on materials and component characterization quality control with the scanning electron microscopy scanning transmission electron microscopy scanning electron microscopy application to semi conductors analytical electron microscopy biological specimen preparation for scanning electron microscopy chicago illinois usa march 28 april 1 1977. Scanning Electron Microscopy 784, 1977

High resolution scanning electron microscopy cytology specimen preparation and intracellular structures observed by scanning electron microscopy. Mueller, M , Et Al (Ed ) The Science Of Biological Specimen Preparation For Microscopy And Microanalysis 1985; 4th Pfefferkorn Conference, Grand Canyon, Ariz , Usa, Mar 25-30, 1985 X+307p Scanning Electron Microscopy, Inc : Amf O'hare, Ill , Usa Illus 245-256, 1986

High resolution scanning electron microscopic cytology - specimen preparation and intracellular structures observed by scanning electron microscopy. Unknown, 1985

Biological transformation of calcium phosphate coating in human implants: Micro-characterization using scanning electron microscopy and high resolution transmission electron microscopy. Cells & Materials 4(1): 63-71, 1994

Specimen preparation for high resolution scanning electron microscopy. 1982

A specimen holder for high-resolution low-temperature scanning electron microscopy. Microscopy Research and Technique 32(5): 457-458, 1995

Spatial Resolution in Scanning Electron Microscopy and Scanning Transmission Electron Microscopy Without a Specimen Vacuum Chamber. Microscopy and Microanalysis 22(4): 754-767, 2016

Double-layer coating for high-resolution low-temperature scanning electron microscopy. Journal Of Microscopy (oxford). 179(3): 229-237, 1995

High resolution scanning electron microscopy of cell organelles by a new specimen preparation method. Biomedical Research (Tokyo) 2(SUPPL): 63-70, 1981

High-resolution scanning-electron microscopy of stereocilia using the osmium-thiocarbohydrazide coating technique. Hearing Research 21(3): 243-249, 1986