Proton Induced X-ray Emission: A tool for non-destructive trace element analysis
Current Science 80(12): 1542-1549
ISSN/ISBN: 0011-3891 Accession: 011220694
The paper describes the basic principle of the Proton Induced X-ray Emission (PIXE) technique for the trace element analysis. The use of this technique depends on the X-ray production cross-section, the fluorescence yield and the background radiation for a particular energy of the proton beam. The details for the sample preparation, high resolution X-ray detector and the multi-target vacuum chamber required for this purpose are given. The application of this technique for trace element analysis of aerosol, biological, archaeological, geological and medical samples are discussed.