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Sub-100-nanometre resolution in total internal reflection fluorescence microscopy



Sub-100-nanometre resolution in total internal reflection fluorescence microscopy



Journal of Microscopy 232(1): 99-105



Combining total internal reflection fluorescence microscopy with structured illumination allows optical wide-field imaging with sub-100-nanometre resolution. We present a novel objective-launch set-up for standing wave illumination that takes advantage of a tunable transmission diffraction grating and transparent phase shifters actuated by electro-active polymers to control the excitation pattern in three dimensions. Image acquisition is completed in less than 1 s.

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Accession: 023706425

Download citation: RISBibTeXText

PMID: 19017206

DOI: 10.1111/j.1365-2818.2008.02075.x



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