Section 44
Chapter 43,055

Evaluation of trace-element sensitivities in PIXE analysis of low-temperature-ashed serum samples

Lecomte, R.; Landsberger, S.; Monaro, S.

International Journal of Applied Radiation and Isotopes 33(2): 121-125


ISSN/ISBN: 0020-708X
PMID: 7061165
DOI: 10.1016/0020-708x(82)90218-6
Accession: 043054409

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Trace-element sensitivities in Pixe analysis are evaluated in serum samples prepared with freeze-drying and low-temperature-ashing techniques. The latter target-preparation method yields better detectability limits for all elements. However, the gain in sensitivity, which is at the most 60% for low-Z elements, is not considered large enough to warrant the use of dry-ashing procedures in Pixe batch-analysis situations as is usually the case in biomedical work.

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