Evaluation of trace-element sensitivities in PIXE analysis of low-temperature-ashed serum samples
Lecomte, R.; Landsberger, S.; Monaro, S.
International Journal of Applied Radiation and Isotopes 33(2): 121-125
1982
ISSN/ISBN: 0020-708X
PMID: 7061165
DOI: 10.1016/0020-708x(82)90218-6
Accession: 043054409
Trace-element sensitivities in Pixe analysis are evaluated in serum samples prepared with freeze-drying and low-temperature-ashing techniques. The latter target-preparation method yields better detectability limits for all elements. However, the gain in sensitivity, which is at the most 60% for low-Z elements, is not considered large enough to warrant the use of dry-ashing procedures in Pixe batch-analysis situations as is usually the case in biomedical work.