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A comparison between three-dimensional and two-dimensional grain boundary plane analysis

A comparison between three-dimensional and two-dimensional grain boundary plane analysis

Ultramicroscopy 90(2-3): 153-162

An EBSD-based methodology for assessment of grain boundary planes, in particular sigma3 boundaries in face-centred cubic materials, has recently been devised. The method is based on trace analysis in a single, two-dimensional section rather than the more arduous three-dimensional method. The paper reports a data set of grain boundary planes in alpha-brass. mainly sigma3s, which have been analysed using both methods so that they can be compared and a recommendation made about the usefulness of the new method. It is shown that the new, two-dimensional method is a valuable tool in the analysis of grain boundary geometry, especially when used in conjunction with v/v(m), a parameter for assessing the proximity to the misorientation reference structure.

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Accession: 045047145

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PMID: 11942634

DOI: 10.1016/s0304-3991(01)00137-1

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