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A new bend-magnet beamline for scanning transmission X-ray microscopy at the Advanced Light Source



A new bend-magnet beamline for scanning transmission X-ray microscopy at the Advanced Light Source



Journal of Synchrotron Radiation 9(Pt 4): 254-257



The high brightness of the bend magnets at the Advanced Light Source has been exploited to illuminate a scanning transmission X-ray microscope (STXM). This is the first diffraction-limited scanning X-ray microscope to operate with a useful count rate on a synchrotron bend-magnet source. A simple dedicated beamline has been built covering the range of photon energy from 250 eV to 600 eV. The beamline is always available and needs little adjustment. Use of this facility is much easier than that of installations that share undulator beams. This facility provides radiation for C 1s, N 1s and O 1s near-edge X-ray absorption spectromicroscopy with STXM count rates in excess of 1 MHz and with spectral resolution typically 1:2000, limited to about 1:5000.

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Accession: 045079032

Download citation: RISBibTeXText

PMID: 12091736

DOI: 10.1107/s0909049502005502


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