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Characterizing hot-carrier transport in silicon heterostructures with the use of ballistic-electron-emission microscopy



Characterizing hot-carrier transport in silicon heterostructures with the use of ballistic-electron-emission microscopy



Physical Review. B Condensed Matter 48(8): 5712-5715




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Accession: 045495570

Download citation: RISBibTeXText

PMID: 10009102

DOI: 10.1103/physrevb.48.5712


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