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Ge overlayers on Si(001) studied by surface-extended x-ray-absorption fine structure



Ge overlayers on Si(001) studied by surface-extended x-ray-absorption fine structure



Physical Review. B, Condensed Matter 52(8): 5824-5829




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Accession: 046151923

Download citation: RISBibTeXText

PMID: 9981772

DOI: 10.1103/PhysRevB.52.5824


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