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Oxygen-deficient line defects in an ultrathin aluminum oxide film



Oxygen-deficient line defects in an ultrathin aluminum oxide film



Physical Review Letters 97(4): 046101



A model for the straight antiphase domain boundary of the ultrathin aluminum oxide film on the NiAl(110) substrate is derived from scanning tunneling microscopy measurements and density-functional theory calculations. Although the local bonding environment of the perfect film is maintained, the structure is oxygen deficient and possesses a favorable adsorption site. The domain boundary exhibits a downwards band bending and three characteristic unoccupied electronic states, in excellent agreement with scanning tunneling spectroscopy measurements.

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Accession: 049839081

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PMID: 16907593

DOI: 10.1103/PhysRevLett.97.046101


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