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Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings

Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings

Applied Optics 53(4): A27-A34

This study compares and quantifies the simulated effects of noise, index errors, and photometric level errors on different optical monitoring layer termination strategies. A computer program to simulate optical thin film monitoring has been written for this work. The study looked at these termination methods: quartz crystal monitoring, photometric level cut, two types of turning point termination, and percent of optical extrema monitoring. A narrow bandpass filter and a four-layer antireflection coating design were simulated as examples.

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Accession: 055783980

Download citation: RISBibTeXText

PMID: 24514225

DOI: 10.1364/AO.53.000A27

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