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Two-probe electrical measurements in transmission electron microscopes--behavioral control of tungsten microwires

Two-probe electrical measurements in transmission electron microscopes--behavioral control of tungsten microwires

Microscopy Research and Technique 72(2): 93

Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using Au electrodes, the current-voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au-W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses.

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Accession: 056723983

Download citation: RISBibTeXText

PMID: 18837439

DOI: 10.1002/jemt.20648

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