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X-ray nanointerferometer based on si refractive bilenses



X-ray nanointerferometer based on si refractive bilenses



Physical Review Letters 103(6): 064801



We report a novel type of x-ray interferometer employing a bilens system consisting of two parallel compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. By closely overlapping such coherent beams, an interference field with a fringe spacing ranging from tens of nanometers to tens of micrometers is produced. In an experiment performed with 12 keV x rays, submicron fringes were observed by scanning and moiré imaging of the test grid. The far field interference pattern was used to characterize the x-ray coherence. Our technique opens up new opportunities for studying natural and man-made nanoscale materials.

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Accession: 056966818

Download citation: RISBibTeXText

PMID: 19792573

DOI: 10.1103/physrevlett.103.064801


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