Non-contact atomic force microscopy of an antiferromagnetic NiO (100) surface using a ferromagnetic tip

Hosoi, H.; Kimura, M.; Hayakawa, K.

Applied Physics A Materials Science and Processing 72(1 Suppl): S23-S26

2001


DOI: 10.1007/s003390100722
Accession: 063005438

Download citation:  
Text
  |  
BibTeX
  |  
RIS

Article/Abstract emailed within 0-6 h
Payments are secure & encrypted
Powered by Stripe
Powered by PayPal

Abstract
We have observed a cleaved Ni O (100) surface by means of non-contact atomic force microscopy (NC-AFM) using a Fe-coated tip. The shape and magnetic properties of the Fe-coated tip are confirmed by ex situ scanning electron microscopy (SEM) and magnetic force microscopy (MFM) imaging. Also, in situ Δf–vmeasurement shows that the contact-potential difference (CPD) is different between non-coated Si and Fe-coated tips. The Fe-coated tip can produce atomically resolved NC-Afm images of a cleaved Ni O (100) surface at room temperature.