Non-Destructive, Large-Scale Imaging of Anti-Phase Disorder in Ga P Epilayers on Si (001) Using Low-Energy Electron Microscopy
Borkenhagen, B.; Doscher, H.; Hannappel, T.; Lilienkamp, G.; Daum, W.
ECS Transactions 45(4): 231-239
2012
ISSN/ISBN: 1938-5862 DOI: 10.1149/1.3700472
Accession: 085968109
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References
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